JPH0523392B2 - - Google Patents

Info

Publication number
JPH0523392B2
JPH0523392B2 JP60117825A JP11782585A JPH0523392B2 JP H0523392 B2 JPH0523392 B2 JP H0523392B2 JP 60117825 A JP60117825 A JP 60117825A JP 11782585 A JP11782585 A JP 11782585A JP H0523392 B2 JPH0523392 B2 JP H0523392B2
Authority
JP
Japan
Prior art keywords
wire
tip
guide body
base end
wire guide
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60117825A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61275669A (ja
Inventor
Ko Nakajima
Katsutoshi Saida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
YOKO KK
Original Assignee
YOKO KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by YOKO KK filed Critical YOKO KK
Priority to JP60117825A priority Critical patent/JPS61275669A/ja
Publication of JPS61275669A publication Critical patent/JPS61275669A/ja
Publication of JPH0523392B2 publication Critical patent/JPH0523392B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP60117825A 1985-05-31 1985-05-31 回路基板等の検査装置 Granted JPS61275669A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60117825A JPS61275669A (ja) 1985-05-31 1985-05-31 回路基板等の検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60117825A JPS61275669A (ja) 1985-05-31 1985-05-31 回路基板等の検査装置

Publications (2)

Publication Number Publication Date
JPS61275669A JPS61275669A (ja) 1986-12-05
JPH0523392B2 true JPH0523392B2 (en]) 1993-04-02

Family

ID=14721173

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60117825A Granted JPS61275669A (ja) 1985-05-31 1985-05-31 回路基板等の検査装置

Country Status (1)

Country Link
JP (1) JPS61275669A (en])

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4506215A (en) * 1981-06-30 1985-03-19 International Business Machines Corporation Modular test probe
US4518910A (en) * 1983-06-30 1985-05-21 International Business Machines Corporation Buckling beam twist probe contactor assembly with spring biased stripper plate

Also Published As

Publication number Publication date
JPS61275669A (ja) 1986-12-05

Similar Documents

Publication Publication Date Title
EP0222119B1 (en) Coaxial probe
US20030189437A1 (en) Notched electrical test probe tip
WO2018078946A1 (ja) ソケット
JPH0127101Y2 (en])
KR20180126387A (ko) 콘택트 프로브 및 검사용 지그
JPH0515108Y2 (en])
CN218567584U (zh) 一种防端子歪斜的端子定位检测装置
JPH0515109Y2 (en])
JPH0523392B2 (en])
JPH0523391B2 (en])
JPH0515107Y2 (en])
JPS61275667A (ja) 回路基板等の検査装置
JPS61294377A (ja) 回路基板等の検査装置
JPH0260066B2 (en])
JPH0127100Y2 (en])
JP2558254Y2 (ja) 検査用プローブピンおよびその差込ソケット
JPH0146829B2 (en])
JPH03199975A (ja) 導電性接触子
JPH0132700Y2 (en])
JPH0623976Y2 (ja) インサーキットテスタ用ピンボード構造
KR20000010492A (ko) 다수의 평행핀을 가진 ic를 지지하는 ic소켓
JPH0329175B2 (en])
JPS61197575U (en])
JPH0512771Y2 (en])
JPH0413662Y2 (en])